Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1038/nmat253210.1038/nmat2532 ↗
2. This work was supported by National Science Foundation (NSF) Science and Technology Center (STC) award DMR-1548924 (STROBE), and by NSF award DMR-1611036. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.
3. 10.1103/PhysRevApplied.10.04406610.1103/PhysRevApplied.10.044066 ↗
4. 10.1103/PhysRev.108.110.1103/PhysRev.108.1 ↗