Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS)

Journal Article Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS) Get access Artem A Trofimov, Artem A Trofimov Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAThe Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Search for other works by this author on: Oxford Academic Google Scholar Matthias Lorenz, Matthias Lorenz Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAThe Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Search for other works by this author on: Oxford Academic Google Scholar Anton Ievlev, Anton Ievlev Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAThe Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Search for other works by this author on: Oxford Academic Google Scholar Stephen T King, Stephen T King Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAThe Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Search for other works by this author on: Oxford Academic Google Scholar Olga S Ovchinnikova, Olga S Ovchinnikova Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAThe Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Search for other works by this author on: Oxford Academic Google Scholar Alex Belianinov Alex Belianinov Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USAThe Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Corresponding author: belianinova@ornl.gov Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 868–869, https://doi.org/10.1017/S1431927619005075 Published: 01 August 2019