k-Scanning: An Alternative to 4D-STEM
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Abstract
Journal Article k-Scanning: An Alternative to 4D-STEM Get access Andrew Barnum Andrew Barnum Thermo-Fisher Scientific, Hillsboro, OR, USA Corresponding author: andrew.barnum@thermofisher.com Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1932–1933, https://doi.org/10.1017/S1431927619010390 Published: 01 August 2019
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Fluorescence Microscopy Techniques
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References (3)
Show source-provided references
1. Plamann · Acta Crystallographica Section A · 1998 · 54 · 6110.1107/S0108767397010507 ↗
2. Spence · High-resolution Electron Microscopy
3. 10.1017/S143192761501566410.1017/S1431927615015664 ↗