Low Temperature Electron Microscopy of “Charge-Ordered” Phases

Scanning transmission electron microscopy (STEM) is highly sensitive to lattice degrees of freedom, enabling tracking of complex lattice displacements with sub-Angstrom resolution and picometer precision Due to tight stability tolerances, most STEM measurements are done at room temperature but as shown recently, cryogenic STEM near liquid nitrogen temperature is possible using available instrumentation and image stack alignment [2 ,3]. This paves the way to mapping subtle lattice and electronic orders which emerge at low temperature.