journal article·2019-08Open access

Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation

Stuart I. Wright, Marc De Graef, Saransh Singh

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

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Research context

OpenAlex topics: Advancements in Photolithography Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Data Storage Technologies

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References (5)

Show source-provided references
1. Wright · Microsc. Microanal. · 2019
2. 10.1007/BF0267555310.1007/BF02675553 ↗
3. 10.1111/j.1365-2818.2008.02011.x10.1111/j.1365-2818.2008.02011.x ↗
4. We acknowledge GS Rohrer of CMU for supplying the Rutile sample and R Witt of EBSD Analytical for collecting the EBSD data. MDG and SS acknowledge an ONR Vannevar Bush Faculty Fellowship (N00014-16-1-2821), and the computational resources of the Materials Characterization Facility at CMU, grant MCF-677785. The work of SS was performed partially under the auspices of the U.S. Department of Energy at Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344 (LLNL-JRNL-XXXXXX)
5. 10.1088/0965-0393/24/8/08501310.1088/0965-0393/24/8/085013 ↗