Measurand-Optimized, Content-Aware Scanning Electron Microscopy
Source abstract
Abstract
András E Vladár, Bradley N Damazo; Measurand-Optimized, Content-Aware Scanning Electron Microscopy, Microscopy and Microanalysis, Volume 25, Issue S2, 1 Au
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Machine Learning in Materials Science
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1117/12.204597710.1117/12.2045977 ↗
2. Vladar , Elimination of Electron-Beam-Induced Carbonaceous Contamination in SEMs and the new RGM 10100 NIST Contamination Testing Artifact (2018) https://www2.avs.org/symposium2018/Papers/Paper_VT-TuP9.html
3. Scipioni , Helium Ion Microscope Advanced Materials and Processes (2008).
4. Contributions of the National Institute of Standards and Technology are not subject to copyright. Mention of commercial products or services in this paper does not imply approval or endorsement by NIST, nor does it imply that such products or services are necessarily the best available for the purpose.