Reducing Radiation Damage Using Pulsed Electron Beams in the TEM

A rise in the development and the use of ultrashort-pulsed sources (i.e., femtosecond to picosecond) in transmission electron microscopes (TEMs) has led to numerous discoveries and paradigm tests of atomic to nanoscale structural dynamics well beyond the temporal limits of fast detectors. Vital to these advances are precise control over the electron emission process, typically via the photoelectric effect, or via temporal modulation of an initially continuous beam swept across an aperture. In addition to enabling ultrafast pump-probe experiments, fine control over the emission process allows for exploration of the effects of such pulsed beams on damage sustained by the specimen during observation. Unlike proposed diffract-before-destroy methods with electrons, these approaches would ideally be applied in the single-electron-per-packet regime, with sufficient time between the arrival of each electron at the specimen for all reversible energy-deposition events to fully recover. Indeed, some intriguing results using pulsed electron beams in TEMs have been reported here, including effects on the structure of catalyst particles and apparent prolonged exposures for polymer crystals