Atomic Resolution Convergent Beam Electron Diffraction Analysis Using Convolutional Neural Networks
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Abstract
Chenyu Zhang, Jie Feng, Luis Rangel DaCosta, Paul M Voyles; Atomic Resolution Convergent Beam Electron Diffraction Analysis Using Convolutional Neural Netw
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides
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References (5)
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1. This work was support by the US Department of Energy, Basic Energy Sciences (DE-FG02-08ER46547) and used facilities support by the Wisconsin MRSEC (DMR-1720415).
2. Pryor · Adv. Struct. Chem. Imaging · 2017
3. 10.1103/PhysRevLett.100.20610110.1103/PhysRevLett.100.206101 ↗
4. 10.1016/j.ultramic.2018.03.00410.1016/j.ultramic.2018.03.004 ↗
5. Krizhevsky · Adv. Neural Inf. Process. Syst · 2012