In situ Cathodoluminescence and Monitoring Electronic Structure Change Using Optical TEM Holder
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Abstract
Mingjie Xu, Sheng Dai, Wenpei Gao, Thomas Blum, Xiaoqing Pan; In situ Cathodoluminescence and Monitoring Electronic Structure Change Using Optical TEM Hold
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Electronic and Structural Properties of Oxides
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References (2)
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1. This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430 and by the National Science Foundation under Grant DMR-1506535. TEM experiments were conducted in the Irvine Materials Research Institute (IMRI) at the University of California-Irvine.
2. 10.1016/j.ultramic.2018.04.01010.1016/j.ultramic.2018.04.010 ↗