journal article·2019-08Open access

Depth Resolved Measurements of Atomic Scale Defects in Ion Irradiated Fe Alloys

F. A. Selim, S. Agarwal, M. O. Liedke, M. Butterling, A. Wagner, P. Hosemann, N. Li, Y. Wang, B. P. Uberuaga

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Ion-surface interactions and analysis · Muon and positron interactions and applications · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (2)

Show source-provided references
1. The work was funded as part of FUTURE, an energy frontier research center funded by DOE, Office of Basic Energy Sciences.
2. 10.1007/978-3-662-03893-210.1007/978-3-662-03893-2 ↗