DataVXMicroscopy and MicroanalysisPaper
journal article·2019-08Open access

High Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM

Frances I. Allen, Thomas C. Pekin, Arun Persaud, Steven J. Rozeveld, Gregory F. Meyers, Jim Ciston, Colin Ophus, Andrew M. Minor

Microscopy and Microanalysis· Volume 25· Issue S2
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Nanomaterials

OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Surface Polishing Techniques · Microstructure and mechanical properties

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References (4)

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1. The authors acknowledge support from the Dow University Partnership Initiative Program. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.
2. 10.1016/j.ultramic.2016.12.02110.1016/j.ultramic.2016.12.021 ↗
3. 10.1038/s41586-018-0298-510.1038/s41586-018-0298-5 ↗
4. 10.1016/j.scriptamat.2017.11.00510.1016/j.scriptamat.2017.11.005 ↗