Transmission Microscopy: Beginning Automation
Source abstract
Abstract
C Barry Carter, David B Williams; Transmission Microscopy: Beginning Automation, Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 22
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Force Microscopy Techniques and Applications
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References (6)
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1. 10.1007/BF0030822610.1007/BF00308226 ↗
2. 10.1007/978-0-387-76501-310.1007/978-0-387-76501-3 ↗
3. Tripathi S , Janish MT , Mook WM , Jungjohann KL , Dongare AM , Dobley A , Carter CB (2018) presented at Fall MRS.
4. Tripathi S , Janish MT , Noor N , Jungjohann KL , Pete D , Kotula PG , Silva H , Carter CB (2018) presented at Fall MRS.
5. 10.1007/978-3-319-26651-010.1007/978-3-319-26651-0 ↗
6. The authors thank their many collaborators, past and present, and in particular Joe Michael, Masashi Watanabe, Paul Kotula and Ian Anderson. They note that all 4 are past-Presidents of MAS and that Drs Anderson and Kotula are the 2017 and 2019 Presidents of MSA. CBC, DBW and PGK have all enjoyed interactions with Terry Mitchell, an MSA past-President and an acronym himself. CBC acknowledges CINT where he currently continues his research and advises on the application of TEM. CINT is the Center for Integrated Nanotechnology and is an Office of Science User Facility operated for the U.S. DOE by National Technology and Engineering Solutions of Sandia (NTES), LLC., which is a wholly owned subsidiary of Honeywell International, Inc., DBW is closely associated with CEMAS.