Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations
Source abstract
Abstract
Shigeyasu Tanaka, Yusuke Ohmi; Application of Ar Ion Beam Milling on Sectioning of Cells for SEM Observations, Microscopy and Microanalysis, Volume 25, Iss
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Advanced Electron Microscopy Techniques and Applications
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References (3)
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1. This work was supported in part by JSPS KAKENHI Grant Number JP18K04246.
2. Hing · Microsc Microanal · 2007 · 13 · 1528
3. 10.1242/jcs.12412310.1242/jcs.124123 ↗