Microstructural and Defect Characterization of Al-Si Alloy Using PFIB and EMPAD

Robert E. A. Williams

doi:10.1017/s1431927619005336

journal article·2019-08Open access

Microstructural and Defect Characterization of Al-Si Alloy Using PFIB and EMPAD

Robert E. A. Williams

Microscopy and Microanalysis· Volume 25· Issue S2

Publisher page Open full text

Source abstract

Abstract

processing as shown in Fig 1. The

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

Metals & alloys

OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Aluminum Alloy Microstructure Properties · Microstructure and mechanical properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (8)

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