Microstructure Characterization of Nanoscale Dielectric Layers on Niobium
Source abstract
Abstract
Heike Störmer, Dagmar Gerthsen; Microstructure Characterization of Nanoscale Dielectric Layers on Niobium, Microscopy and Microanalysis, Volume 9, Issue S0
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Copper Interconnects and Reliability · Semiconductor materials and devices · Anodic Oxide Films and Nanostructures
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References
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