journal article·2003-08Open access

Experience with the IBM Sub-Angstrom STEM

P. E. Batson

Microscopy and Microanalysis· Volume 9· Issue S02

Abstract

After installation of the Nion spherical aberration corrector in the IBM 120kV VG Microscopes HB501 STEM, it has been apparent that the probe size has become about 0.78 , somewhat smaller than expected. [1, 2] While this is a welcome outcome, it does present difficulties in understanding, particularly given that we have identified some very real issues relating to interpretation of the results.
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Research context

OpenAlex topics: Teaching and Learning Programming · Genetics, Bioinformatics, and Biomedical Research · Distributed and Parallel Computing Systems

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