Crystallographic and Nanomechanical Analysis by Correlative In-situ AFM & SEM
Source abstract
Abstract
P Frank, M Leitner, S Hummel, N Hosseini, Y Wang, R Winkler, G E Fantner, H Plank, Y Zeng, C H Schwalb; Crystallographic and Nanomechanical Analysis by Cor
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Electron Microscopy Techniques and Applications · Microstructure and mechanical properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (1)
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1. 10.1038/srep1639310.1038/srep16393 ↗