Atomically Resolved EELS Elemental and Fine Structure Mapping via Multi-Frame and Energy-Offset Correction Acquisition
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Abstract
Yi Wang, Michael R S Huang, Ute Salzberger, Kersten Hahn, Wilfried Sigle, Peter A van Aken; Atomically Resolved EELS Elemental and Fine Structure Mapping v
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides
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References (4)
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1. 10.1016/j.ultramic.2008.02.00310.1016/j.ultramic.2008.02.003 ↗
2. 10.1103/PhysRevB.88.11512010.1103/PhysRevB.88.115120 ↗
3. 10.1016/j.ultramic.2017.10.01410.1016/j.ultramic.2017.10.014 ↗
4. 10.1016/j.ultramic.2016.06.00110.1016/j.ultramic.2016.06.001 ↗