Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials
Source abstract
Abstract
Jean-Nicolas Audinot, Florian Vollnhals, Paul Gratia, Santhana Eswara, Patrick Philipp, Tom Wirtz; Secondary Ion Mass Spectrometry on the Helium Ion Micros
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
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5. 10.1021/acsenergylett.7b0098110.1021/acsenergylett.7b00981 ↗
6. 10.1021/jacs.6b1004910.1021/jacs.6b10049 ↗
7. 10.1021/acs.analchem.7b0125610.1021/acs.analchem.7b01256 ↗