Automatic Calibrations of Sample Misalignment for Nanotomography at SSRF
Source abstract
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. Journal of Synchrotron Radiation · 2007 · 14.5 · 395
2. Review of Scientific Instruments · 2010 · 81.10 · 103502
3. Microscopy and Microanalysis · 2014 · 20.2 · 531
4. Applied Physics A · 2008 · 92.3 · 447