High Resolution S/TEM Study of Defects in MOCVD Grown Mono to Few Layer WS2
Source abstract
Abstract
Saiphaneendra Bachu, Danielle Reifsnyder Hickey, Tanushree H Choudhury, Mikhail Chubarov, Joan M Redwing, Nasim Alem; High Resolution S/TEM Study of Defect
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: 2D Materials and Applications · Semiconductor materials and interfaces · Nanowire Synthesis and Applications
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References (4)
Show source-provided references
1. ACS nano · 2012 · 7 · 791
2. 10.1021/nl400747910.1021/nl4007479 ↗
3. Nano letters · 2018
4. 10.1021/nn500064s10.1021/nn500064s ↗