Characterization of Si Surface by SEM-SXES using Low Incident Voltage
Source abstract
Abstract
Yasuaki Yamamoto, Hideyuki Takahashi, Takanori Murano, Naoki Kikuchi, Natasha Erdman; Characterization of Si Surface by SEM-SXES using Low Incident Voltage
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Anodic Oxide Films and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1093/jmicro/dfr07610.1093/jmicro/dfr076 ↗
2. Microscopy and Microanalysis · 2016 · 22 · 422