STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging

Yi Wang; Y. Eren Suyolcu; Ute Salzberger; Kersten Hahn; Vesna Srot; Wilfried Sigle; Peter A. van Aken

doi:10.1017/s1431927618001150

journal article·2018-08Open access

STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging

Yi Wang, Y. Eren Suyolcu, Ute Salzberger, Kersten Hahn, Vesna Srot, Wilfried Sigle, Peter A. van Aken

Microscopy and Microanalysis· Volume 24· Issue S1

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Abstract

Yi Wang, Y Eren Suyolcu, Ute Salzberger, Kersten Hahn, Vesna Srot, Wilfried Sigle, Peter A van Aken; STEM SI Warp: A Tool for Correcting the Linear and Non

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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques

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References (5)

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