journal article·2018-08Open access

Bravais Lattice of TiAl Determined from a Single Electron Backscatter Diffraction Pattern

Ming Han, Guangming Zhao

Microscopy and Microanalysis· Volume 24· Issue S1

Abstract

Ming Han, Guangming Zhao; Bravais Lattice of TiAl Determined from a Single Electron Backscatter Diffraction Pattern, Microscopy and Microanalysis, Volume 2
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Intermetallics and Advanced Alloy Properties · nanoparticles nucleation surface interactions · Inorganic Chemistry and Materials

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References (2)

Show source-provided references
1. 10.1016/j.msea.2003.12.01510.1016/j.msea.2003.12.015 ↗
2. 10.3390/met607016510.3390/met6070165 ↗