Compressive Sensing Reconstruction for EDS Analysis
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electrical and Bioimpedance Tomography · Non-Destructive Testing Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (6)
Show source-provided references
1. 10.1093/jmicro/dft04210.1093/jmicro/dft042 ↗
2. 10.1021/nl202253a10.1021/nl202253a ↗
3. Microscopy and Microanalysis · 2016 · 22 · 778
4. 10.1137/11083748610.1137/110837486 ↗
5. 10.1017/S143192761600365210.1017/S1431927616003652 ↗
6. 10.1109/TIT.2005.86208310.1109/TIT.2005.862083 ↗