High-resolution 3D scanning X-ray microscopes at the Swiss Light Source

Ptychography is a promising method to overcome limitations of traditional X-ray imaging schemes in resolution and depth-of-field. A sample is scanned at overlapping positions through a coherent beam of X-rays and for each spot a far-field diffraction pattern is recorded. A real-space image is reconstructed using iterative algorithms. At multi-keV photon energies the penetration depth allows imaging thick samples where 3D reconstructions are crucial for understanding the internal structure of the sample measured. This can be achieved by measuring the sample at various orientations and combining these measurements via computed tomography.