Contributions to High Resolution and In Situ Electron Microscopy
Source abstract
Abstract
Robert Sinclair, Yunzhi Liu, Sangchul Lee, Ai Leen Koh; Contributions to High Resolution and In Situ Electron Microscopy, Microscopy and Microanalysis, Vol
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (20)
Show source-provided references
1. 10.1016/S0304-3991(96)00099-X10.1016/S0304-3991(96)00099-X ↗
2. 10.1039/C6NR06231H10.1039/C6NR06231H ↗
3. 10.1016/j.ultramic.2008.04.01410.1016/j.ultramic.2008.04.014 ↗
4. 2016 · 3
5. 10.1080/0141863950824030510.1080/01418639508240305 ↗
6. J. Electron. Microsc. · 1958 · 6 · 8
7. 10.1107/S010876738800744510.1107/S0108767388007445 ↗
8. Soc. Bull · 2013 · 38 · 1065
9. 10.1038/322531a010.1038/322531a0 ↗
10. 10.1080/1478643050003654610.1080/14786430500036546 ↗
11. 10.1038/298127a010.1038/298127a0 ↗
12. 10.1143/JJAP.7.94610.1143/JJAP.7.946 ↗
13. 10.1038/290386a010.1038/290386a0 ↗
14. 10.1016/0304-3991(94)90115-510.1016/0304-3991(94)90115-5 ↗
15. 10.1126/science.233.4766.87210.1126/science.233.4766.872 ↗
16. 10.1103/PhysRevLett.56.61610.1103/PhysRevLett.56.616 ↗
17. 10.1143/JJAP.19.L110.1143/JJAP.19.L1 ↗
18. 10.1143/JPSJ.42.107310.1143/JPSJ.42.1073 ↗
19. 10.1016/j.ultramic.2016.12.00910.1016/j.ultramic.2016.12.009 ↗
20. 10.1038/nnano.2011.16110.1038/nnano.2011.161 ↗