Quantitative Characterization of Crystal Defects in Planetary Materials in a Scanning Electron Microscope (SEM)
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Abstract
Shirin Kaboli, Pamela C Burnley; Quantitative Characterization of Crystal Defects in Planetary Materials in a Scanning Electron Microscope (SEM), Microscop
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques
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References (2)
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1. 473
2. 10.1016/S0968-4328(97)00032-210.1016/S0968-4328(97)00032-2 ↗