Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope
Source abstract
Abstract
Nico Klingner, Gregor Hlawacek, Rene Heller, Johannes von Borany, Stefan Facsko; Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · X-ray Spectroscopy and Fluorescence Analysis
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References (3)
Show source-provided references
1. 10.1016/j.jlumin.2014.09.01610.1016/j.jlumin.2014.09.016 ↗
2. 10.1016/j.ultramic.2015.12.00510.1016/j.ultramic.2015.12.005 ↗
3. 2014 · 32 · 020801