Diffraction Contrast Scanning Transmission Electron Microscopy - A Bend-contour-free Way to Image Dislocations, Voids and Precipitates
Source abstract
Abstract
Yuanyuan Zhu, Colin Ophus, Mychailo B Toloczko, Danny J Edwards; Diffraction Contrast Scanning Transmission Electron Microscopy - A Bend-contour-free Way t
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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References (1)
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1. 10.1016/j.ultramic.2011.07.00110.1016/j.ultramic.2011.07.001 ↗