Exploring the Limits of Focused-Probe STEM Ptychography
Source abstract
Abstract
P D Nellist, G T Martinez, C O’Leary, L Jones; Exploring the Limits of Focused-Probe STEM Ptychography, Microscopy and Microanalysis, Volume 24, Issue S1,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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References (2)
Show source-provided references
1. 10.1038/ncomms1253210.1038/ncomms12532 ↗
2. Journal of Instrumentation · 2016 · 11 · 04006