Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy

Ping Lu; Lin Zhou; Jon Ihlefeld; Wei Pan

doi:10.1017/s143192761800082x

journal article·2018-08Open access

Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy

Ping Lu, Lin Zhou, Jon Ihlefeld, Wei Pan

Microscopy and Microanalysis· Volume 24· Issue S1

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Abstract

Ping Lu, Lin Zhou, Jon Ihlefeld, Wei Pan; Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocompo

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Electronic and Structural Properties of Oxides · Ferroelectric and Piezoelectric Materials · Multiferroics and related materials

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References (4)

Show source-provided references

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3. Sci. Rep. · 2014 · 4 · 394510.1038/srep03945 ↗

4. 10.1016/S1369-7021(12)70137-210.1016/S1369-7021(12)70137-2 ↗