A Method to Prepare TEM Specimens by Focused Ion Beam Milling for Cu/diamond Composites
Source abstract
Abstract
Luhua Wang, Hailong Zhang, Xitao Wang, Jinguo Wang, Moon J Kim; A Method to Prepare TEM Specimens by Focused Ion Beam Milling for Cu/diamond Composites, Mi
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Integrated Circuits and Semiconductor Failure Analysis · Copper Interconnects and Reliability
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
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3. J. Adv. Mater. · 2007 · 39 · 3
4. 10.1016/j.compositesa.2007.08.01210.1016/j.compositesa.2007.08.012 ↗