journal article·2018-08Open access

Sample Dependent Resolution of Transmission Electron Microscopy in Water or Ice

Niels de Jonge

Microscopy and Microanalysis· Volume 24· Issue S1

Abstract

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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (3)

Show source-provided references
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2. 10.1016/j.ultramic.2018.01.00710.1016/j.ultramic.2018.01.007 ↗
3. 10.1038/nnano.2011.16110.1038/nnano.2011.161 ↗