Very Large Area EDS Spectral Images: Impact of Latest Silicon Drift Detector Technology
Source abstract
Abstract
Jon J McCarthy, John F Konopka; Very Large Area EDS Spectral Images: Impact of Latest Silicon Drift Detector Technology, Microscopy and Microanalysis, Volu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Geophysical and Geoelectrical Methods
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. Micros. Microanal · 15 · 484
2. Micros. Microanal · 2017 · 1066
3. Microbeam Analysis · 1992 · 89
4. Nucl. Instrum. Methods A · 1984 · 42 · 12