Utilizing Atom Probe Tomography for 3-D Quantification of Point Defects
Source abstract
Abstract
Brian P Gorman, George Burton, David R Diercks; Utilizing Atom Probe Tomography for 3-D Quantification of Point Defects, Microscopy and Microanalysis, Volu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Metal and Thin Film Mechanics
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1039/C5TA10064J10.1039/C5TA10064J ↗
2. 10.1021/acs.nanolett.6b0291810.1021/acs.nanolett.6b02918 ↗
3. 10.1111/jace.1313510.1111/jace.13135 ↗
4. 10.1016/j.actamat.2015.09.03510.1016/j.actamat.2015.09.035 ↗