Combining in-Situ SEM with High Sensitivity Analytical TEM for Understanding the Degradation of Metallic Interconnects in SOFC
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Abstract
Stéphane Poitel, Zhu-Jun Wang, Marc Willinger, Jan van Herle, Cécile Hébert; Combining in-Situ SEM with High Sensitivity Analytical TEM for Understanding t
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electrocatalysts for Energy Conversion · Semiconductor materials and devices · Ion-surface interactions and analysis
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References (3)
Show source-provided references
1. 10.1149/1.357024810.1149/1.3570248 ↗
2. 10.1016/j.jpowsour.2015.01.12810.1016/j.jpowsour.2015.01.128 ↗
3. 10.1016/j.ijhydene.2006.08.00510.1016/j.ijhydene.2006.08.005 ↗