Quantitative Specimen Electric Potential Maps Using Segmented and Pixel Detectors in Scanning Transmission Electron Microscopy

H.G. Brown; N. Shibata; Z. Chen; M. Weyland; T.C. Petersen; D.M. Paganin; M.J. Morgan; H. Sasaki; L. J. Allen; S. D. Findlay

doi:10.1017/s1431927617002896

journal article·2017-07Open access

Quantitative Specimen Electric Potential Maps Using Segmented and Pixel Detectors in Scanning Transmission Electron Microscopy

H.G. Brown, N. Shibata, Z. Chen, M. Weyland, T.C. Petersen, D.M. Paganin, M.J. Morgan, H. Sasaki, L. J. Allen, S. D. Findlay

Microscopy and Microanalysis· Volume 23· Issue S1

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Abstract

HG Brown, N Shibata, Z Chen, M Weyland, TC Petersen, DM Paganin, MJ Morgan, H Sasaki, L J Allen, S D Findlay; Quantitative Specimen Electric Potential Maps

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Advanced Electron Microscopy Techniques and Applications

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References (4)

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1. 10.1016/j.ultramic.2015.09.00210.1016/j.ultramic.2015.09.002 ↗

2. 10.1016/j.ultramic.2016.06.00910.1016/j.ultramic.2016.06.009 ↗

3. The authors acknowledge funding from the Australian Research Council’s Discovery Projects funding scheme (Projects No. DP140102538 and DP160102338).

4. 10.1103/PhysRevB.93.13411610.1103/PhysRevB.93.134116 ↗