Focused Ion Beams for Imaging, Analysis, and Fabrication - Where Did They Come From and Where are They Going?
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Abstract
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Advanced Electron Microscopy Techniques and Applications
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References (2)
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1. 10.1016/0169-4332(95)00351-710.1016/0169-4332(95)00351-7 ↗
2. Feynman · Caltech Engineering and Science · Feb. (1960 · 23 · 22