Revealing the Structure of Graphitic Carbon Nitride through Low-Dose TEM using a Direct Electron Detector
Source abstract
Abstract
Diane M Haiber, Peter A Crozier; Revealing the Structure of Graphitic Carbon Nitride through Low-Dose TEM using a Direct Electron Detector, Microscopy and
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Electronic and Structural Properties of Oxides · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. Support from the U.S. DOE (DE-SC0004954), use of AC-TEM at the John M. Cowley Center for High Resolution Electron Microscopy, use of the K2 IS camera courtesy of Gatan, and use of XRD equipment within the LeRoy Eyring Center for Solid State Science at ASU are gratefully acknowledged.
2. 10.1038/nmat231710.1038/nmat2317 ↗
3. 10.1017/S143192761600577810.1017/S1431927616005778 ↗
4. 10.1002/chem.20060175910.1002/chem.200601759 ↗