Scientific Analysis of NPAR Processing of EBSD Results for Beam-Sensitive Materials
Source abstract
Abstract
Patrick P Camus, Stuart I Wright, Matthew M Nowell, Rene de Kloe; Scientific Analysis of NPAR Processing of EBSD Results for Beam-Sensitive Materials, Micr
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advancements in Photolithography Techniques · Electron and X-Ray Spectroscopy Techniques · Silicon and Solar Cell Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
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1. 10.1016/j.ultramic.2015.08.00110.1016/j.ultramic.2015.08.001 ↗
2. 10.1179/174328406X13087610.1179/174328406X130876 ↗
3. Wright · Advanced Materials and Processes. · 2008 · 166 · 29
4. Specimen courtesy of E. Griesshaber, Geo- und Umweltwisschaften, Ludwig-Maximilians-Universitat Munchen.