High Resolution Imaging of Short-Range Order Materials (Allophane) with Aberration Corrected TEM and Direct Electron Detection
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Abstract
Thomas G Sharp, Shery LY Chang; High Resolution Imaging of Short-Range Order Materials (Allophane) with Aberration Corrected TEM and Direct Electron Detect
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Planetary Science and Exploration · Nuclear Physics and Applications
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References (3)
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1. 10.1016/j.icarus.2004.10.02210.1016/j.icarus.2004.10.022 ↗
2. Coleman · U.S. Geological Survey Professional Paper · 1981 · 1246 · 51
3. 10.1130/G33215.110.1130/G33215.1 ↗