DataVXMicroscopy and MicroanalysisPaper
journal article·2017-07Open access

Collection of Selected Area Electron Channeling Patterns (SACP) on an FEI Helios NanoLab Scanning Electron Microscope

R.D. Kerns, S. Balachandran, A.H. Hunter, M.A. Crimp

Microscopy and Microanalysis· Volume 23· Issue S1
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Abstract

RD Kerns, S Balachandran, AH Hunter, MA Crimp; Collection of Selected Area Electron Channeling Patterns (SACP) on an FEI Helios NanoLab Scanning Electron M
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Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques

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References (2)

Show source-provided references
1. 10.1002/jemt.2029310.1002/jemt.20293 ↗
2. 10.1016/j.ultramic.2014.11.00410.1016/j.ultramic.2014.11.004 ↗