Development of Multiple New 120 kV Transmission Electron Microscope Configurations Applicable for a Wide Range of Fields

K. Tamura; T. Fujii; H. Mise; I. Nagaoki; K. Kageyama; A. Wakui; M. Shirai; H. Matsumoto; M. Konomi; T. Yaguchi

doi:10.1017/s143192761700099x

journal article·2017-07Open access

Development of Multiple New 120 kV Transmission Electron Microscope Configurations Applicable for a Wide Range of Fields

K. Tamura, T. Fujii, H. Mise, I. Nagaoki, K. Kageyama, A. Wakui, M. Shirai, H. Matsumoto, M. Konomi, T. Yaguchi

Microscopy and Microanalysis· Volume 23· Issue S1

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Abstract

K Tamura, T Fujii, H Mise, I Nagaoki, K Kageyama, A Wakui, M Shirai, H Matsumoto, M Konomi, T Yaguchi; Development of Multiple New 120 kV Transmission Elec

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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena

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References (2)

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1. Kamino T. , et al, Proc. of IMC 18, Prague, Czech Republic (2014) IT-6-P-1552.

2. 10.1017/S143192761300863510.1017/S1431927613008635 ↗