Atom Probe Tomography Quantification of Alloy Fluctuations in (Al,In,Ga)N
Source abstract
Abstract
Bastien Bonef, Matthew Laurent, Stacia Keller, Umesh K Mishra; Atom Probe Tomography Quantification of Alloy Fluctuations in (Al,In,Ga)N, Microscopy and Mi
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Metal and Thin Film Mechanics · Ion-surface interactions and analysis
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References (7)
Show source-provided references
1. Rigutti · Scripta Materialia · 2017
2. Bonef B. & Laurent M. contributed equally to this work.
3. 10.1186/s11671-016-1668-210.1186/s11671-016-1668-2 ↗
4. 10.1063/1.490183410.1063/1.4901834 ↗
5. 10.1063/1.494153110.1063/1.4941531 ↗
6. 10.1063/1.494361210.1063/1.4943612 ↗
7. 10.1016/j.ultramic.2015.04.01210.1016/j.ultramic.2015.04.012 ↗