Three-Dimensional Point Defect Imaging by Large-angle Illumination STEM
Source abstract
Abstract
Ryo Ishikawa, Stephen J Pennycook, Andrew R Lupini, Scott D Findlay, Naoya Shibata, Yuichi Ikuhara; Three-Dimensional Point Defect Imaging by Large-angle I
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (6)
Show source-provided references
1. 10.1038/nature2104210.1038/nature21042 ↗
2. 10.1016/j.ultramic.2014.11.00910.1016/j.ultramic.2014.11.009 ↗
3. 10.1063/1.496570910.1063/1.4965709 ↗
4. 10.1093/jmicro/dfv01410.1093/jmicro/dfv014 ↗
5. 10.1093/jmicro/dfp03310.1093/jmicro/dfp033 ↗
6. A part of this work was supported by the Research & Development Initiative for Scientific Innovation of New Generation Batteries II (RISING II). A.R.L. was supported by the Office of Basic Energy Sciences, Materials Sciences and Engineering Division, U.S. Department of Energy.