journal article·2017-07Open access

What Can We Learn from the Shapes of Secondary Electron Puddles on Direct Electron Detectors?

Abhik Datta, See Wee Chee, Benjamin Bammes, Liang Jin, Duane Loh

Microscopy and Microanalysis· Volume 23· Issue S1

Abstract

Abhik Datta, See Wee Chee, Benjamin Bammes, Liang Jin, Duane Loh; What Can We Learn from the Shapes of Secondary Electron Puddles on Direct Electron Detect
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Ga2O3 and related materials

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References (4)

Show source-provided references
1. The authors would like to acknowledge the use of the EM facility at the NUS Center for BioImaging Sciences, and help from Ping Lee Chong and Jian Shi.
2. Jin · Electronic Theses and Dissertations · 2009 · b6636471
3. 10.1016/j.ultramic.2009.07.00410.1016/j.ultramic.2009.07.004 ↗
4. 10.1016/j.ultramic.2014.08.00210.1016/j.ultramic.2014.08.002 ↗