A Novel Method for Higher Order Aberration Correction in Electron Microscopes
Source abstract
Abstract
Shahedul Hoque, Hiroyuki Ito, Akio Takaoka, Ryuji Nishi; A Novel Method for Higher Order Aberration Correction in Electron Microscopes, Microscopy and Micr
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
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References (3)
Show source-provided references
1. Nishi · 2014 · 200
2. 10.1016/j.ultramic.2015.11.00510.1016/j.ultramic.2015.11.005 ↗
3. Munro's Electron Beam Software Ltd., http://www.mebs.co.uk/.