The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques
Source abstract
Abstract
J-L Rouviere, B Haas, E Robin, D Cooper, N Bernier, M Williamson; The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques, Micros
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Surface and Thin Film Phenomena · Electron and X-Ray Spectroscopy Techniques
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References (5)
Show source-provided references
1. Haas B. , et al EMC conf. proc, Lyon 28 August - 2 September, (2016).
2. 10.1016/j.micron.2015.09.00110.1016/j.micron.2015.09.001 ↗
3. 10.1021/acs.nanolett.5b0448910.1021/acs.nanolett.5b04489 ↗
4. Rouviere J.L. , et al. FCMN conference proceeding (2015) p. 38 (available at www.nist.gov).
5. Robin · US patent · 2016 · 0169668 · A1