Plasma Cleaning Improves the Image Quality of Serial Block-face Scanning Electron Microscopy (SBFSEM) Volumetric Data Sets
Source abstract
Abstract
Barbara Armbruster, Christopher Booth, Stuart Searle, Michael Cable, Ronald Vane; Plasma Cleaning Improves the Image Quality of Serial Block-face Scanning
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (3)
Show source-provided references
1. 10.1371/journal.pbio.002032910.1371/journal.pbio.0020329 ↗
2. 10.1017/S143192761600108210.1017/S1431927616001082 ↗
3. 10.1017/S143192761600636X10.1017/S143192761600636X ↗